Product image application CHRocodile CLS

3D Metrology - Line Sensors

CHRocodile CLS HS

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Ultra-precise inline quality control at high speed

The ultra-precise, non-contact CHRocodile CLS HS confocal line sensor enables relatively high-speed inline measurements for quality inspection purposes. This device’s outstanding qualities are its high lateral resolution and the absence of any channel cross-talk.

Suitable applications: 

The CLS HS is ideally suited to inspecting bumps, wire bonds (<20 µm) and stents for coronary heart vessels, and measuring catheters. 

Product picture CHRocodile CLS

Advantages

  • Outstanding lateral resolution:
    The various probes available for the CLS HS offer you the choice of an outstanding lateral resolution of up to 1 µm combined with a shorter line or a long line of up to 8 mm with a lower lateral resolution.
  • No shadowing effect:
    With this line scanner’s coaxial technology, incoming light and detected light follow the same path so there is no angle between the incoming and detecting beam. This enables measurement of various geometries where shadowing would be an issue with a triangular set-up.
  • High numerical aperture probes:
    Whatever your measuring task, e.g. measuring roughness, coplanarity, or bump height, we offer you a wide range of optical probes. The high numerical aperture probes are perfectly suited for precise non-contact distance and thickness measurements under angles of 44° for mirror-like surfaces and scattering surfaces up to 80°.
  • High speed:
    The CHRocodile CLS HS is optimized for fast inline inspection of large areas with a measurement rate of up to 6,000 lines/sec, which adds up to more than 1 million measuring points/sec.
  • Angled versions:
    The angled version of the CHRocodile CLS HS is the ideal fit, especially for inspection machines where space is limited.

Technical data

  • Measuring rate (lines per second): up to 6,000 for CHRocodile CLS HS
  • Measuring range: 200 µm - 3,900 µm, depends on selected optical probe
  • Lateral resolution: 1 µm - 8,5 µm, depends on selected optical probe

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[Translate to Englisch:] Inbetriebnahme
Commissioning 3D Metrology

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